[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Mismatch Measure Improvement Using Kelvin Test Structures in Transistor Pair Configuration in Sub-Hundred Nanometer MOSFET Technology

✍ Scribed by Mezzomo, Cecilia M.; Marin, Mathieu; Leyris, Cedric; Ghibaudo, Gerard

• Book ID: 118166234
• Publisher: IEEE
• Year: 2009
• Weight: 314 KB
• Volume: 0
• Category: Article
• ISBN: 1424442591
• DOI: 10.1109/icmts.2009.4814611