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[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - S-Parameter-Based Modal Decomposition of Multiconductor Transmission Lines and Its Application to De-Embedding

✍ Scribed by Amakawa, S.; Yamanaga, K.; Ito, H.; Sato, T.; Ishihara, N.; Masu, K.

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