[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - Impact of emitter resistance mismatch on base and collector current matching in bipolar transistors

✍ Scribed by Danaie, S.; Perrotin, A.; Ghibaudo, G.; Vildeuil, J.-C.; Morin, G.; Laurens, M.

• Book ID: 120005750
• Publisher: IEEE
• Year: 2006
• Weight: 276 KB
• Category: Article
• ISBN-13: 9781424401673
• DOI: 10.1109/ICMTS.2006.1614295