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[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Dependence of dielectric time to breakdown distributions on test structure area

✍ Scribed by Vollertsen, R.-P.; Kleppmann, W.G.

Book ID: 111890262
Publisher: IEEE
Year: 1991
Weight: 439 KB
Volume: 0
Category: Article
ISBN-13: 9780879425883
DOI: 10.1109/icmts.1990.161716

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