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[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Gate chain structures with on-chip clock generators for realistic high-speed dynamic stress

✍ Scribed by Shiono, N.; Mizusawa, T.

Book ID: 121864450
Publisher: IEEE
Year: 1991
Weight: 208 KB
Category: Article
ISBN-13: 9780879425883
DOI: 10.1109/ICMTS.1990.161755

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