𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - MOSFET statistical parameter extraction using multivariate statistics

✍ Scribed by Power, J.A.; Mathewson, A.; Lane, W.A.

Book ID: 126607318
Publisher: IEEE
Year: 1991
Weight: 537 KB
Category: Article
ISBN-13: 9780879425883
DOI: 10.1109/ICMTS.1990.161743

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Dependence of dielectric time to breakdown distributions on test structure area

✍ Vollertsen, R.-P.; Kleppmann, W.G. 📂 Article 📅 1991 🏛 IEEE ⚖ 439 KB

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Fully-automated line-width measurement system and its applications

✍ Yoshizawa, M.; Wada, K. 📂 Article 📅 1991 🏛 IEEE ⚖ 359 KB

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Novel test structures for the characterization of latch-up tolerance in a bipolar and MOSFET merged device

✍ Momose, H.; Maeda, T.; Inoue, K.; Urakawa, Y.; Maeguchi, K. 📂 Article 📅 1991 🏛 IEEE ⚖ 361 KB

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - A modified sliding wire potentiometer test structure for mapping nanometer-level distances

✍ Cresswell, M.W.; Gaitan, M.; Allen, R.A.; Linholm, L.W. 📂 Article 📅 1991 🏛 IEEE ⚖ 510 KB

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Examination of LOCOS process parameters and the measurement of effective width

✍ Fallon, M.; Robertson, J.M.; Walton, A.J.; Holwill, R.J. 📂 Article 📅 1991 🏛 IEEE ⚖ 292 KB

[IEEE 1991 International Conference on M

[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - A technique for measuring threshold mismatch in DRAM sense amplifier devices

✍ Sprogis, E.J. 📂 Article 📅 1991 🏛 IEEE ⚖ 279 KB