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[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Novel test structures for the characterization of latch-up tolerance in a bipolar and MOSFET merged device

✍ Scribed by Momose, H.; Maeda, T.; Inoue, K.; Urakawa, Y.; Maeguchi, K.

Book ID: 126631857
Publisher: IEEE
Year: 1991
Weight: 361 KB
Category: Article
ISBN-13: 9780879425883
DOI: 10.1109/ICMTS.1990.161747

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