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[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - The inverter matrix: a vehicle for assessing process quality through inverter parameter analysis of variance

✍ Scribed by Hannaman, D.J.; Buehler, M.G.; Chang, J.; Sayah, H.R.

Book ID: 126485420
Publisher: IEEE
Year: 1991
Weight: 310 KB
Category: Article
ISBN-13: 9780879425883
DOI: 10.1109/ICMTS.1990.161722

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