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Hot-carrier degradation of submicrometer p-MOSFETs with thermal/LPCVD composite oxide

✍ Scribed by Lee, Y.-H.; Yau, L.D.; Hansen, E.; Chau, R.; Sabi, B.; Hossaini, S.; Asakawa, B.

Book ID: 114535450
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 594 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.249440

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