✦ LIBER ✦
Improved hot-carrier immunity of p-MOSFET's with 8nm thick nitrided gate-oxide during bi-directional stressing
✍ Scribed by A. Bravaix; D. Vuillaume; D. Goguenheim; D. Dorval; M. Haond
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 328 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0167-9317
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