✦ LIBER ✦
Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide
✍ Scribed by A. Acovic; C.C.-H. Hsu; L.C. Hsia; J.M. Aitken
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 334 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0038-1101
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