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High resolution deep level transient spectroscopy applied to extended defects in silicon

✍ Scribed by Evans-Freeman, J H; Emiroglu, D; Vernon-Parry, K D; Murphy, J D; Wilshaw, P R

Book ID: 121359000
Publisher: Institute of Physics
Year: 2005
Tongue: English
Weight: 182 KB
Volume: 17
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/17/22/009

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