Investigation of neutron radiation defects in silicon by high discriminability deep level transient spectroscopy (HDDLTS)

✍ Scribed by Wu Fengmei; Shi Yi; Wang Changhe

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 394 KB
• Volume: 103
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(90)90200-5