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Generating tests for delay faults in nonscan circuits

✍ Scribed by Agrawal, P.; Agrawal, V.D.; Seth, S.C.

Book ID: 118166929
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 839 KB
Volume: 10
Category: Article
ISSN: 0740-7475
DOI: 10.1109/54.199801

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