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Stuck-at-fault testing for quasi-delay-insensitive logic circuits

โœ Scribed by Arthit Thongtak; Takashi Nanya

Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
186 KB
Volume
29
Category
Article
ISSN
0882-1666

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โœฆ Synopsis

In Quasi-Delay-Insensitive (QDI) circuits, some single stuck-at-faults may cause run-away transitions without stopping normal transitions. This paper clarifies problems in detecting such stuck-at-faults and proposes a method for generating test sequences for these problems. In this method, a test sequence is generated by searching for faulty excitation in a specified state transition series and by using a stable condition confirmed by an 8-value logic simulation. This paper also describes a method of using additional test terminals for control and observation signals specified in terms of the logic simulation to find otherwise undetectable faults. The effectiveness of the proposed method is experimentally confirmed by using a benchmark circuit.

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