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Test generation for IDDQ testing of bridging faults in CMOS circuits

✍ Scribed by Bollinger, S.W.; Midkiff, S.F.

Book ID: 119777891
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 726 KB
Volume: 13
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.329270

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