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Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits

โœ Scribed by Yoshinobu Higami; Yuzo Takamatsu; Kewal K. Saluja; Kozo Kinoshita

Book ID
110262866
Publisher
Springer US
Year
2000
Tongue
English
Weight
50 KB
Volume
16
Category
Article
ISSN
0923-8174

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Static test compaction for IDDQ testing
Static test compaction for IDDQ testing of bridging faults in sequential circuits
โœ Yoshinobu Higami; Kewal K. Saluja; Yuzo Takamatsu; Kozo Kinoshita ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 335 KB ๐Ÿ‘ 2 views

This paper presents a static test compaction method for IDDQ testing of sequential circuits. Test compaction reduces test application time and tester memory and consequently reduces testing cost. Particularly for IDDQ testing, measurement of IDDQ is time-consuming, and thus test compaction is a very