✦ LIBER ✦

IDDQ Testing of Opens in CMOS SRAMs

✍ Scribed by Victor H. Champac; José Castillejos; Joan Figueras

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

IDDQ Testing of Submicron CMOS—by Coolin

✍ M. Rencz; V. Székely; S. Török; K. Torki; B. Courtois 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 283 KB

Possibilities and limitations of IDDQ te

✍ Figueras, J.; Ferre, A. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 147 KB

Dynamic Power Supply Current Testing of

✍ Jian Liu; Rafic Z. Makki; Ayman Kayssi 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 227 KB

A simple built-in current sensor for IDD

✍ A. Srivastava; S. Aluri; A.K. Chamakura 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 938 KB

Analysis and Test of Resistive-Open Defe

✍ Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Magali Ba 📂 Article 📅 2007 🏛 Springer US 🌐 English ⚖ 231 KB

Real-Time Soft-Error Testing Results of

✍ Seifert, N.; Kirsch, M. 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 916 KB