✦ LIBER ✦
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
✍ Scribed by Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian
- Book ID
- 106384330
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 231 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0923-8174
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