✦ LIBER ✦

IDDQ Testing of Submicron CMOS—by Cooling?

✍ Scribed by M. Rencz; V. Székely; S. Török; K. Torki; B. Courtois

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Possibilities and limitations of IDDQ te

✍ Figueras, J.; Ferre, A. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 147 KB

IDDQ Testing of Opens in CMOS SRAMs

✍ Victor H. Champac; José Castillejos; Joan Figueras 📂 Article 📅 1999 🏛 Springer US 🌐 English ⚖ 79 KB

A simple built-in current sensor for IDD

✍ A. Srivastava; S. Aluri; A.K. Chamakura 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 938 KB

Production of submicron-sized multihollo

✍ M. Okubo; A. Ito; T. Kanenobu 📂 Article 📅 1996 🏛 Springer ⚖ 913 KB

Noise and speed characteristics of test

✍ J.C Santiard; F Faccio 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 254 KB

Self-Driven Cracking by Crack-Face Cooli

✍ Jianye Wang; Luc J. Vandeperre 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 284 KB