✦ LIBER ✦
Real-Time Soft-Error Testing Results of 45-nm, High-K Metal Gate, Bulk CMOS SRAMs
✍ Scribed by Seifert, N.; Kirsch, M.
- Book ID
- 118054723
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 916 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9499
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