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Gate Rupture in Ultra-Thin Gate Oxides Irradiated With Heavy Ions

✍ Scribed by Silvestri, Marco; Gerardin, Simone; Paccagnella, Alessandro; Ghidini, Gabriella


Book ID
118253325
Publisher
IEEE
Year
2009
Tongue
English
Weight
601 KB
Volume
56
Category
Article
ISSN
0018-9499

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