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[IEEE 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Jyvaskyla, Finland (2008.09.10-2008.09.12)] 2008 European Conference on Radiation and Its Effects on Components and Systems - Gate rupture in ultra-thin gate oxides irradiated with heavy ions

✍ Scribed by Silvestri, M.; Gerardin, S.; Paccagnella, A.; Ghidini, G.

Book ID: 118253288
Publisher: IEEE
Year: 2008
Weight: 433 KB
Volume: 0
Category: Article
ISBN: 1457704811
DOI: 10.1109/radecs.2008.5782694

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