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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Radiation characterization of the austriamicrosystems 0.35 µm CMOS technology

✍ Scribed by Ramos-Martos, J.; Arias-Drake, A.; Ragel-Morales, A.; Ceballos-Caceres, J.; Mora-Gutierrez, J. M.; Pinero-Garcia, B.; Munoz-Diaz, M.; Lagos-Florido, M. A.; Espejo-Meana, S.

Book ID: 118217659
Publisher: IEEE
Year: 2011
Weight: 662 KB
Volume: 0
Category: Article
ISBN: 1457705850
DOI: 10.1109/radecs.2011.6131335

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