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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Characterization of bulk damage in CMOS MAPS with deep N-well collecting electrode

✍ Scribed by Zucca, Stefano; Ratti, Lodovico; Traversi, Gianluca; Bettarini, Stefano; Morsani, Fabio; Rizzo, Giuliana; Bosisio, Luciano; Rashevskaya, Irina; Cindro, Vladimir

Book ID: 118044791
Publisher: IEEE
Year: 2011
Weight: 995 KB
Volume: 0
Category: Article
ISBN: 1457705850
DOI: 10.1109/radecs.2011.6131308

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