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Breakdown of gate oxides during irradiation with heavy ions

✍ Scribed by Johnston, A.H.; Swift, G.M.; Miyahira, T.; Edmonds, L.D.

Book ID: 118253173
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 1014 KB
Volume: 45
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.736491

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