✦ LIBER ✦
Simulation of the time-dependent breakdown characteristics of heavy-ion irradiated gate oxides using a mean-reverting Poisson-Gaussian process
✍ Scribed by Miranda, E.; Cester, A.; Sune, J.; Paccagnella, A.; Ghidini, G.
- Book ID
- 118253323
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 200 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9499
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