✦ LIBER ✦
Experimental study about gate oxide damages in patterned MOS capacitor irradiated with heavy ions
✍ Scribed by G. Busatto; G. Currò; F. Iannuzzo; A. Porzio; A. Sanseverino; F. Velardi
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 865 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0026-2714
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