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Exposure characteristics and three-dimensional profiling of SU8C resist using electron beam lithography

โœ Scribed by Wong, W. H.; Pun, E. Y. B.


Book ID
121847507
Publisher
AVS (American Vacuum Society)
Year
2001
Tongue
English
Weight
634 KB
Volume
19
Category
Article
ISSN
0734-211X

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