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Eliminating Back-Gate Bias Effects in a Novel SOI High-Voltage Device Structure

✍ Scribed by Xiaorong Luo; Daping Fu; Lei Lei; Bo Zhang; Zhaoji Li; Shengdong Hu; Zhengyuan Zhang; Zhicheng Feng; Bin Yan

Book ID: 114619680
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 1006 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2024027

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