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Analysis and optimization of the back-gate effect on lateral high-voltage SOI devices

✍ Scribed by Schwantes, S.; Florian, T.; Stephan, T.; Graf, M.; Dudek, V.

Book ID: 114617883
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 584 KB
Volume: 52
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.850952

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