✦ LIBER ✦
Compact modeling of the effects of parasitic internal fringe capacitance on the threshold voltage of high-k gate-dielectric nanoscale SOI MOSFETs
✍ Scribed by Kumar, M.J.; Gupta, S.K.; Venkataraman, V.
- Book ID
- 114618171
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 299 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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