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Electroluminescence Spectral Imaging of Extended Defects in 4H-SiC

✍ Scribed by A.J. Giles; J.D. Caldwell; R.E. Stahlbush; B.A. Hull; N.A. Mahadik; O.J. Glembocki; K.D. Hobart; K.X. Liu

No coin nor oath required. For personal study only.

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