✦ LIBER ✦
Cross-sectional TEM and KOH-Etch Studies of Extended Defects in 3C-SiCp+nJunction Diodes Grown on 4H-SiC Mesas
✍ Scribed by Kevin M. Speer; Philip G. Neudeck; David J. Spry; Andrew J. Trunek; Pirouz Pirouz
- Book ID
- 107455033
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 566 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0361-5235
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