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Photoluminescence and Electroluminescence Imaging of Carrot Defect in 4H-SiC Epitaxy

✍ Scribed by Kendrick X. Liu; Robert E. Stahlbush; Mark E. Twigg; Joshua D. Caldwell; Evan R. Glaser; Karl D. Hobart; Francis J. Kub


Book ID
107453574
Publisher
Springer US
Year
2007
Tongue
English
Weight
435 KB
Volume
36
Category
Article
ISSN
0361-5235

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## Abstract The identity and characteristics of the lifetime limiting defects in n‐type 4H‐SiC epitaxial layers are of particular current interest, due to the suitability of this material for high‐power, solid‐state switching devices. Much work has been done in the past decade to identify the spect