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Effects of avalanche hole injection in fluorinated SiO/sub 2/ MOS capacitors

✍ Scribed by Vishnubhotla, L.; Ma, T.-P.; Hsing-Huang Tseng; Tobin, P.J.

Book ID: 118118452
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 249 KB
Volume: 14
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.215152

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