Enhanced injection in n++-poly/SiOx/SiO2 /p-sub MOS capacitors for low-voltage nonvolatile memory applications: experiment

✍ Scribed by Irrera, F.; Russo, F.

• Book ID: 114537937
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 268 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.808071