Electrical degradation and recovery of dielectrics in n++-poly-Si/SiOx/SiO2/p-sub structures designed for application in low-voltage non-volatile memories

✍ Scribed by Fernanda Irrera

• Book ID: 108361844
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 152 KB
• Volume: 41
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(01)00094-4