OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbOB2O3SiO2GeO2 glasses. The effects of OH content

✍ Scribed by Keiji Kobayashi; Ichiro Mizushima

• Book ID: 115989940
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 208 KB
• Volume: 180
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/0022-3093(94)90400-6