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Degradation of oxides and oxynitrides under hot hole stress

โœ Scribed by Zhang, J.F.; Sii, H.K.; Groesendeken, G.; Degraeve, R.


Book ID
114538037
Publisher
IEEE
Year
2000
Tongue
English
Weight
210 KB
Volume
47
Category
Article
ISSN
0018-9383

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