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Hot electron and hot hole degradation of UHV/CVD SiGe HBT's

โœ Scribed by Gogineni, U.; Cressler, J.D.; Niu, G.; Harame, D.L.


Book ID
114538215
Publisher
IEEE
Year
2000
Tongue
English
Weight
169 KB
Volume
47
Category
Article
ISSN
0018-9383

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