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Noise parameter optimization of UHV/CVD SiGe HBT's for RF and microwave applications

✍ Scribed by Guofu Niu; Ansley, W.E.; Shiming Zhang; Cressler, J.D.; Webster, C.S.; Groves, R.A.

Book ID: 114537806
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 348 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.777145

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