✦ LIBER ✦
Reliability of ultra-thin silicon dioxide under substrate hot-electron, substrate hot-hole and tunneling stress
✍ Scribed by Eric M. Vogel; Monica D. Edelstein; John S. Suehle
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 282 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0167-9317
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