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Hot electron degradation of the DC and RF characteristics of AlGaAs/InGaAs/GaAs PHEMT's

✍ Scribed by Borgarino, M.; Menozzi, R.; Baeyens, Y.; Cova, P.; Fantini, F.

Book ID: 114537119
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 173 KB
Volume: 45
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.658668

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