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Degradation of direct-tunneling gate oxide under hot hole injection

✍ Scribed by Yoshinari Kamakura; Kazuaki Deguchi; Akihiro Ishida; Shigeyasu Uno; Kenji Taniguchi


Book ID
102161325
Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
201 KB
Volume
140
Category
Article
ISSN
0424-7760

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