✦ LIBER ✦
Efficiency of interface trap generation under hole injections in 2.1 nm thick gate-oxide P-MOSFETs
✍ Scribed by Alain Bravaix; Didier Goguenheim; Nathalie Revil; Laurent Rubaldo; Emmanuel Vincent
- Book ID
- 117146496
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 275 KB
- Volume
- 322
- Category
- Article
- ISSN
- 0022-3093
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