✦ LIBER ✦
Temperature dependent hole fluence to breakdown in thin gate oxides under FowlerâNordheim electron tunneling injection
✍ Scribed by Satake, Hideki; Toriumi, Akira
- Book ID
- 120215290
- Publisher
- American Institute of Physics
- Year
- 1995
- Tongue
- English
- Weight
- 284 KB
- Volume
- 66
- Category
- Article
- ISSN
- 0003-6951
- DOI
- 10.1063/1.113782
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