Characterization of accumulation layer capacitance for extracting data on high-κ gate dielectrics

✍ Scribed by Kar, S.; Rawat, S.; Rakheja, S.; Reddy, D.

• Book ID: 114617833
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 557 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2005.848867