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Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs

✍ Scribed by Hyuk-Min Kwon; Won-Ho Choi; In-Shik Han; Min-Ki Na; Sang-Uk Park; Jung-Deuk Bok; Chang-Yong Kang; Byoung-Hun Lee; Raj Jammy; Hi-Deok Lee

No coin nor oath required. For personal study only.

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