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Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs

โœ Scribed by P. Srinivasan; E. Simoen; L. Pantisano; C. Claeys; D. Misra


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
295 KB
Volume
80
Category
Article
ISSN
0167-9317

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